V. Wang and K. L. Shepard, “On-chip transistor characterisation arrays for variability analysis” Electronics Letters, Vol. 43, No. 15, July, 19, 2007.

Abstract

efficiently and accurately characterise large, dense arrays of transistors for variability studies is designed. The prototype macro is used to perform current–voltage characterisation of a 2.8 mm2, 1600- transistor array with digital interfaces.